Сканирующий туннельный микроскоп

Сканирующий туннельный микроскоп
The Nanosurf Easyscan 2 is a modular scanning probe microscopy system that offers flexibility at a great price: one controller, several scan head types, and various upgrade possibilities! Meant to resolve atomic structures at the surface of electrically conductive materials, this easy-to-use and compact, scanning tunnelling microscope is particularly suitable for training purposes. The complete system includes a probe for row-by-row scanning of sample surfaces with the measuring tip, vibration-absorbing pad, controller with computer interface, as well as graphite and gold samples.



Experiment topics:

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  Tunnel effect


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  Representation of individual atoms


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  Representation of lattice defects and dislocations


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  Representation of charge density waves


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  Dependence of tunnel current on distance between measuring tip and sample


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  PID control of tunnel current

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  Windows 2000 or higher


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  XYZ grid: 500x500x200 nm?


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  Minimum increment XY: 7.6 pm


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  Minimum increment Z: 3 pm


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  Tunnel current: 0.100 …100.000 nA (0.025 nA increment)


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  Voltage: ±10.000 V (0.005 V increment)


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  Maximum sample size: 10 mm diam.


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  Supply voltage: 90 – 240 V, 50/60 Hz


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  Connection: USB

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  Controller


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  Installation CD with measurement and control software


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  Scanning probe with connection cable


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  Cover with lens


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  Experiment plate with vibration damping


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  Tool kit for manufacturing the probe tip (side cutters, flat-nose pliers, pointed and rounded tweezers)


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  Platinum-iridium wire, 0.25 mm diam., 300 mm


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  Graphite (HOPG) sample on a carrier


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  Gold (1.1.1) sample on a carrier


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  Set of 4 sample carriers